1. Shodhganga@INFLIBNET
  2. Indian Institute of Engineering Science and Technology, Shibpur
  3. School of VLSI Technology
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/465445
Title: Testing of Analog Circuits using Statistical and Machine Learning Techniques
Researcher: Srimani, Supriyo
Guide(s): Rahaman, Hafizur
Keywords: Engineering
Engineering and Technology
Engineering Multidisciplinary
University: Indian Institute of Engineering Science and Technology, Shibpur
Completed Date: 2021
Abstract: Attached
Pagination: 246
URI: http://hdl.handle.net/10603/465445
Appears in Departments:School of VLSI Technology

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File103.79 kBAdobe PDFView/Open
02_prelim pages.pdf282.92 kBAdobe PDFView/Open
03_contents.pdf89.93 kBAdobe PDFView/Open
04_abstract.pdf80.51 kBAdobe PDFView/Open
05_chapter 1.pdf134.85 kBAdobe PDFView/Open
06_chapter 2.pdf1.22 MBAdobe PDFView/Open
07_chapter 3.pdf1.84 MBAdobe PDFView/Open
08_chapter 4.pdf3.45 MBAdobe PDFView/Open
09_chapter 5.pdf5.29 MBAdobe PDFView/Open
10_chapter 6.pdf1.18 MBAdobe PDFView/Open
11_annexure.pdf637.1 kBAdobe PDFView/Open
80_recommendation.pdf212.87 kBAdobe PDFView/Open
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