Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/463054
Title: Study of the growth and physico chemical properties of ion induced nano layered structure
Researcher: JOY MUKHERJEE
Guide(s): Prasanta Karmarkar
Keywords: AFM
EELS
Ion Bombardment
Modification by Low Energy
Si, Mica, Bandgap, Dielectric
Surface and Interface
TEM
UV-VIS
XPS
XRR
University: Homi Bhabha National Institute
Completed Date: 2022
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/463054
Appears in Departments:Department of Physical Sciences

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01_title.pdfAttached File203.56 kBAdobe PDFView/Open
02_prelim_pages.pdf4.31 MBAdobe PDFView/Open
03_content.pdf211.59 kBAdobe PDFView/Open
04_abstract.pdf294.79 kBAdobe PDFView/Open
05_chapter_1.pdf810.41 kBAdobe PDFView/Open
06_chapter_2.pdf824.59 kBAdobe PDFView/Open
07_chapter_3.pdf2.39 MBAdobe PDFView/Open
08_chapter_4.pdf1.45 MBAdobe PDFView/Open
09_chapter_5.pdf2.25 MBAdobe PDFView/Open
10_annexures.pdf3.23 MBAdobe PDFView/Open
11_chapter_6.pdf294.79 kBAdobe PDFView/Open
18_certificate.pdf178.79 kBAdobe PDFView/Open
19_list_of_graph_and_table.pdf377.29 kBAdobe PDFView/Open
20_other_info.pdf1.7 MBAdobe PDFView/Open
21_highlights.pdf131.81 kBAdobe PDFView/Open
80_recommendation.pdf203.56 kBAdobe PDFView/Open
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