Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/460081
Title: Performance assessment of scaled charge trap flash memory cell for improved reliability
Researcher: Bohara, Pooja
Guide(s): Vishvakarma, Santosh Kumar
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Indore
Completed Date: 2021
Abstract: Available newline
Pagination: 90p.
URI: http://hdl.handle.net/10603/460081
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File24.45 kBAdobe PDFView/Open
02_prelim pages.pdf753.9 kBAdobe PDFView/Open
03_contents.pdf129.1 kBAdobe PDFView/Open
04_abstract.pdf125.77 kBAdobe PDFView/Open
05_chapter 1.pdf967.29 kBAdobe PDFView/Open
06_chapter 2.pdf619.89 kBAdobe PDFView/Open
07_chapter 3.pdf850.15 kBAdobe PDFView/Open
08_chapter 4.pdf748.41 kBAdobe PDFView/Open
80_recommendation.pdf218.28 kBAdobe PDFView/Open
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