Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/459987
Title: Studies on Glancing Angle Deposited Axial TiO2 In2O3 Heterostructure Nanowires for Photodetector and Wettability Applications
Researcher: Pheiroijam Pooja
Guide(s): P Chinnamuthu
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: National Institute of Technology Nagaland
Completed Date: 2022
Abstract: TiO2/In2O3 nanowire (NW), TiO2 NW and In2O3 NW were fabricated on p-type Si newlinesubstrate inside e-beam evaporator employing glancing angle deposition (GLAD) newlinetechnique. Tailoring the deposition rate as well as substrate rotation rate, the newlinevertical and separated In2O3 NW on p-Si substrate was successfully grown. The newlinemorphologies of as-deposited In2O3 NWs structures were studied using field newlineemission scanning electron microscopy (FESEM) and transmission electron newlinemicroscopy (TEM). The In2O3 NW showed low dark current conduction compared newlineto In2O3 thin film (TF) newline
Pagination: 
URI: http://hdl.handle.net/10603/459987
Appears in Departments:Electronics and Communication Engineering

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80_recommendation.pdfAttached File113.23 kBAdobe PDFView/Open
abstract.pdf116.7 kBAdobe PDFView/Open
annexures.pdf8.69 MBAdobe PDFView/Open
chapter1.pdf421.93 kBAdobe PDFView/Open
chapter2.pdf494.99 kBAdobe PDFView/Open
chapter3.pdf631.67 kBAdobe PDFView/Open
chapter4.pdf682.96 kBAdobe PDFView/Open
chapter5.pdf2.63 MBAdobe PDFView/Open
chapter6.pdf2.27 MBAdobe PDFView/Open
chapter7.pdf113.23 kBAdobe PDFView/Open
contents.pdf88.92 kBAdobe PDFView/Open
prelims.pdf371.67 kBAdobe PDFView/Open
title.pdf96.05 kBAdobe PDFView/Open
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