Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/459114
Title: Studies in Defect Tolerance of Nanoscale Crossbar Circuits
Researcher: Kule, Malay
Guide(s): Rahaman, Hafizur and Bhattacharya, Bhargab B.
Keywords: Computer Science
Computer Science Information Systems
Engineering and Technology
University: Indian Institute of Engineering Science and Technology, Shibpur
Completed Date: 2019
Abstract: Attached
Pagination: 177
URI: http://hdl.handle.net/10603/459114
Appears in Departments:Department of Information Technology

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01_title.pdfAttached File716.93 kBAdobe PDFView/Open
02_prelim pages.pdf253.06 kBAdobe PDFView/Open
03_contents.pdf136.32 kBAdobe PDFView/Open
04_abstract.pdf140.31 kBAdobe PDFView/Open
05_chapter 1.pdf162.37 kBAdobe PDFView/Open
06_chapter 2.pdf999.06 kBAdobe PDFView/Open
07_chapter 3.pdf565.59 kBAdobe PDFView/Open
08_chapter 4.pdf1.2 MBAdobe PDFView/Open
09_chapter 5.pdf631.91 kBAdobe PDFView/Open
10_chapter 6.pdf899.64 kBAdobe PDFView/Open
11_annexure.pdf235.84 kBAdobe PDFView/Open
80_recommendation.pdf863.66 kBAdobe PDFView/Open
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