1. Shodhganga@INFLIBNET
  2. University of Kerala
  3. Department of Optoelectronics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/457652
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2023-02-09T11:38:16Z-
dc.date.available2023-02-09T11:38:16Z-
dc.identifier.urihttp://hdl.handle.net/10603/457652-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleDevelopment of Nondestructive Evaluation Methods for Morphological and Thermal Characterization of Nanostructured Thin Films
dc.title.alternative
dc.creator.researcherSoumya, S
dc.subject.keywordNondestructive Evaluation Methods
dc.subject.keywordOptoelectronics
dc.subject.keywordPhysical Sciences
dc.description.note
dc.contributor.guideSankararaman, S
dc.publisher.placeThiruvananthapuram
dc.publisher.universityUniversity of Kerala
dc.publisher.institutionDepartment of Optoelectronics
dc.date.registered
dc.date.completed2021
dc.date.awarded2022
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Optoelectronics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File89.03 kBAdobe PDFView/Open
02_prelim pages.pdf5.63 MBAdobe PDFView/Open
03_contents.pdf435.78 kBAdobe PDFView/Open
04_chapter 1.pdf15.96 MBAdobe PDFView/Open
05_chapter 2.pdf7.72 MBAdobe PDFView/Open
06_chapter 3.pdf6.63 MBAdobe PDFView/Open
07_chapter 4.pdf6.33 MBAdobe PDFView/Open
08_chapter 5.pdf5.45 MBAdobe PDFView/Open
09_chapter 6.pdf6.39 MBAdobe PDFView/Open
10_chapter 7.pdf6.12 MBAdobe PDFView/Open
11_chapter 8.pdf2.33 MBAdobe PDFView/Open
12_annexures.pdf16.75 MBAdobe PDFView/Open
80_recommendation.pdf2.41 MBAdobe PDFView/Open
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