1. Shodhganga@INFLIBNET
  2. University of Kerala
  3. Department of Optoelectronics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/457652
Title: Development of Nondestructive Evaluation Methods for Morphological and Thermal Characterization of Nanostructured Thin Films
Researcher: Soumya, S
Guide(s): Sankararaman, S
Keywords: Nondestructive Evaluation Methods
Optoelectronics
Physical Sciences
University: University of Kerala
Completed Date: 2021
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/457652
Appears in Departments:Department of Optoelectronics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File89.03 kBAdobe PDFView/Open
02_prelim pages.pdf5.63 MBAdobe PDFView/Open
03_contents.pdf435.78 kBAdobe PDFView/Open
04_chapter 1.pdf15.96 MBAdobe PDFView/Open
05_chapter 2.pdf7.72 MBAdobe PDFView/Open
06_chapter 3.pdf6.63 MBAdobe PDFView/Open
07_chapter 4.pdf6.33 MBAdobe PDFView/Open
08_chapter 5.pdf5.45 MBAdobe PDFView/Open
09_chapter 6.pdf6.39 MBAdobe PDFView/Open
10_chapter 7.pdf6.12 MBAdobe PDFView/Open
11_chapter 8.pdf2.33 MBAdobe PDFView/Open
12_annexures.pdf16.75 MBAdobe PDFView/Open
80_recommendation.pdf2.41 MBAdobe PDFView/Open
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