Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/454714
Title: | Studies On The Basic Interaction And The Dosimetric Properties Of Unflattened Megavoltage X Ray Beam With High Z Implant Materials And Its Imaging Benefits |
Researcher: | Tamilarasan R |
Guide(s): | Ramesh Babu P |
Keywords: | Physical Sciences Physics Physics Multidisciplinary |
University: | Vellore Institute of Technology (VIT) University |
Completed Date: | 2022 |
Abstract: | newline |
Pagination: | 1-145 |
URI: | http://hdl.handle.net/10603/454714 |
Appears in Departments: | School of Advanced Sciences |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 90.09 kB | Adobe PDF | View/Open |
02_prelim page.pdf | 1.34 MB | Adobe PDF | View/Open | |
03_table of content.pdf | 450.32 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 92.56 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 3.17 MB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 355.67 kB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 1.44 MB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 1.4 MB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 917.07 kB | Adobe PDF | View/Open | |
10_chapter 6.pdf | 55.78 kB | Adobe PDF | View/Open | |
11_annexures.pdf | 1.93 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 144.24 kB | Adobe PDF | View/Open |
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