Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/454714
Title: Studies On The Basic Interaction And The Dosimetric Properties Of Unflattened Megavoltage X Ray Beam With High Z Implant Materials And Its Imaging Benefits
Researcher: Tamilarasan R
Guide(s): Ramesh Babu P
Keywords: Physical Sciences
Physics
Physics Multidisciplinary
University: Vellore Institute of Technology (VIT) University
Completed Date: 2022
Abstract: newline
Pagination: 1-145
URI: http://hdl.handle.net/10603/454714
Appears in Departments:School of Advanced Sciences

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File90.09 kBAdobe PDFView/Open
02_prelim page.pdf1.34 MBAdobe PDFView/Open
03_table of content.pdf450.32 kBAdobe PDFView/Open
04_abstract.pdf92.56 kBAdobe PDFView/Open
05_chapter 1.pdf3.17 MBAdobe PDFView/Open
06_chapter 2.pdf355.67 kBAdobe PDFView/Open
07_chapter 3.pdf1.44 MBAdobe PDFView/Open
08_chapter 4.pdf1.4 MBAdobe PDFView/Open
09_chapter 5.pdf917.07 kBAdobe PDFView/Open
10_chapter 6.pdf55.78 kBAdobe PDFView/Open
11_annexures.pdf1.93 MBAdobe PDFView/Open
80_recommendation.pdf144.24 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: