Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/453916
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DC FieldValueLanguage
dc.coverage.spatialElectronic Systems Engineering
dc.date.accessioned2023-01-29T16:45:10Z-
dc.date.available2023-01-29T16:45:10Z-
dc.identifier.urihttp://hdl.handle.net/10603/453916-
dc.description.abstractAvailable newline newline
dc.format.extentxxxii, 151 p.
dc.languageEnglish
dc.relationNA
dc.rightsuniversity
dc.titleAtomic level investigation and proposals to address technological roadblocks and reliability challenges in 2d material based nanoelectronic devices
dc.title.alternativeNa
dc.creator.researcherKumar, Jeevesh
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.description.note
dc.contributor.guideShrivastava, Mayank
dc.publisher.placeBangalore
dc.publisher.universityIndian Institute of Science Bangalore
dc.publisher.institutionElectronic Systems Engineering
dc.date.registered
dc.date.completed2022
dc.date.awarded2022
dc.format.dimensions30 cm
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Electronic Systems Engineering



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