Atomic level investigation and proposals to address technological roadblocks and reliability challenges in 2d material based nanoelectronic devices

Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/453916

Title:	Atomic level investigation and proposals to address technological roadblocks and reliability challenges in 2d material based nanoelectronic devices
Researcher:	Kumar, Jeevesh
Guide(s):	Shrivastava, Mayank
Keywords:	Engineering Engineering and Technology Engineering Electrical and Electronic
University:	Indian Institute of Science Bangalore
Completed Date:	2022
Abstract:	Available newline newline
Pagination:	xxxii, 151 p.
URI:	http://hdl.handle.net/10603/453916
Appears in Departments:	Electronic Systems Engineering

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01_title.pdf	Attached File	67.78 kB	Adobe PDF	View/Open
02_prelim pages.pdf		192.58 kB	Adobe PDF	View/Open Request a copy
03_table of contents.pdf		76.7 kB	Adobe PDF	View/Open Request a copy
04_abstract.pdf		74.28 kB	Adobe PDF	View/Open Request a copy
05_chapter 1.pdf		2.36 MB	Adobe PDF	View/Open Request a copy
06_chapter 2.pdf		4.06 MB	Adobe PDF	View/Open Request a copy
07_chapter 3.pdf		2.13 MB	Adobe PDF	View/Open Request a copy
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09_chapter 5.pdf		4.46 MB	Adobe PDF	View/Open Request a copy
10_chapter 6.pdf		1.04 MB	Adobe PDF	View/Open Request a copy
11_chapter 7.pdf		1.08 MB	Adobe PDF	View/Open Request a copy
12_chapter 8.pdf		3.07 MB	Adobe PDF	View/Open Request a copy
13_chapter 9.pdf		3.8 MB	Adobe PDF	View/Open Request a copy
14_annexure.pdf		178.88 kB	Adobe PDF	View/Open Request a copy
80_recommendation.pdf		135.17 kB	Adobe PDF	View/Open Request a copy

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