Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/449292
Title: Test and Recovery of Through Silicon Vias TSVs in Three Dimensional Integrated Circuits 3D ICs
Researcher: Maity, Dilip Kumar
Guide(s): Roy, Surajit Kumar
Keywords: Computer Science
Computer Science Information Systems
Engineering and Technology
University: Indian Institute of Engineering Science and Technology, Shibpur
Completed Date: 2022
Abstract: Attached
Pagination: 169
URI: http://hdl.handle.net/10603/449292
Appears in Departments:Department of Information Technology

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01_title.pdfAttached File174.56 kBAdobe PDFView/Open
02_prelim pages.pdf308.03 kBAdobe PDFView/Open
03_content.pdf121.86 kBAdobe PDFView/Open
04-abstract.pdf54.38 kBAdobe PDFView/Open
05_chapter 1.pdf329.84 kBAdobe PDFView/Open
06_chapter 2.pdf228.12 kBAdobe PDFView/Open
07_chapter 3.pdf700.15 kBAdobe PDFView/Open
08_chapter 4.pdf1.04 MBAdobe PDFView/Open
09_chapter 5.pdf547.05 kBAdobe PDFView/Open
10_chapter 6.pdf730.01 kBAdobe PDFView/Open
11_chapter 7.pdf736.44 kBAdobe PDFView/Open
13_annexure.pdf174.93 kBAdobe PDFView/Open
80_recommendation.pdf249.28 kBAdobe PDFView/Open
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