Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/449292
Title: | Test and Recovery of Through Silicon Vias TSVs in Three Dimensional Integrated Circuits 3D ICs |
Researcher: | Maity, Dilip Kumar |
Guide(s): | Roy, Surajit Kumar |
Keywords: | Computer Science Computer Science Information Systems Engineering and Technology |
University: | Indian Institute of Engineering Science and Technology, Shibpur |
Completed Date: | 2022 |
Abstract: | Attached |
Pagination: | 169 |
URI: | http://hdl.handle.net/10603/449292 |
Appears in Departments: | Department of Information Technology |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 174.56 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 308.03 kB | Adobe PDF | View/Open | |
03_content.pdf | 121.86 kB | Adobe PDF | View/Open | |
04-abstract.pdf | 54.38 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 329.84 kB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 228.12 kB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 700.15 kB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 1.04 MB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 547.05 kB | Adobe PDF | View/Open | |
10_chapter 6.pdf | 730.01 kB | Adobe PDF | View/Open | |
11_chapter 7.pdf | 736.44 kB | Adobe PDF | View/Open | |
13_annexure.pdf | 174.93 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 249.28 kB | Adobe PDF | View/Open |
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