1. Shodhganga@INFLIBNET
  2. Indian Institute of Technology Indore
  3. Department of Electrical Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/444607
Title: Design techniques for bias temperature instability aware and soft error resilient nanoscale circuits
Researcher: Shah, Ambika Prasad
Guide(s): Vishvakarma, Santosh Kumar
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Indore
Completed Date: 2019
Abstract: Available newline
Pagination: 172p.
URI: http://hdl.handle.net/10603/444607
Appears in Departments:Department of Electrical Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File84.61 kBAdobe PDFView/Open
02_prelim pages.pdf374.4 kBAdobe PDFView/Open
03_contents.pdf138.92 kBAdobe PDFView/Open
04_abstract.pdf54.19 kBAdobe PDFView/Open
05_chapter 1.pdf610.44 kBAdobe PDFView/Open
06_chapter 2.pdf1.53 MBAdobe PDFView/Open
07_chapter 3.pdf887.84 kBAdobe PDFView/Open
08_chapter 4.pdf1.02 MBAdobe PDFView/Open
09_chapter 5.pdf1.32 MBAdobe PDFView/Open
10_chapter 6.pdf722.28 kBAdobe PDFView/Open
11_chapter 7.pdf1.38 MBAdobe PDFView/Open
12_chapter 8.pdf824.63 kBAdobe PDFView/Open
13_annexure files.pdf331.94 kBAdobe PDFView/Open
80_recommendation.pdf300.14 kBAdobe PDFView/Open
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