Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/435134
Title: Thermal Modeling Of Transistors A Study On The Static Behavior Of Sige Hbt Soi
Researcher: NIDHIN, K
Guide(s): Anjan, Chakravorty and Deleep R Nair
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Madras
Completed Date: 2022
Abstract: newline
Pagination: xvi, 147
URI: http://hdl.handle.net/10603/435134
Appears in Departments:Electrical Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File339.69 kBAdobe PDFView/Open
02_prelim pages.pdf465.53 kBAdobe PDFView/Open
03_content.pdf93.43 kBAdobe PDFView/Open
04_abstract.pdf92.86 kBAdobe PDFView/Open
05_chapter 1.pdf438.1 kBAdobe PDFView/Open
06_chapter 2.pdf398.1 kBAdobe PDFView/Open
07_chapter 3.pdf315.34 kBAdobe PDFView/Open
08_chapter 4.pdf683.25 kBAdobe PDFView/Open
09_chapter 5.pdf1.04 MBAdobe PDFView/Open
10_annexures.pdf183.39 kBAdobe PDFView/Open
11_chapter 6.pdf472.25 kBAdobe PDFView/Open
12_chapter 7.pdf97.34 kBAdobe PDFView/Open
80_recommendation.pdf97.34 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: