Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/435134
Title: | Thermal Modeling Of Transistors A Study On The Static Behavior Of Sige Hbt Soi |
Researcher: | NIDHIN, K |
Guide(s): | Anjan, Chakravorty and Deleep R Nair |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | Indian Institute of Technology Madras |
Completed Date: | 2022 |
Abstract: | newline |
Pagination: | xvi, 147 |
URI: | http://hdl.handle.net/10603/435134 |
Appears in Departments: | Electrical Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 339.69 kB | Adobe PDF | View/Open |
02_prelim pages.pdf | 465.53 kB | Adobe PDF | View/Open | |
03_content.pdf | 93.43 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 92.86 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 438.1 kB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 398.1 kB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 315.34 kB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 683.25 kB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 1.04 MB | Adobe PDF | View/Open | |
10_annexures.pdf | 183.39 kB | Adobe PDF | View/Open | |
11_chapter 6.pdf | 472.25 kB | Adobe PDF | View/Open | |
12_chapter 7.pdf | 97.34 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 97.34 kB | Adobe PDF | View/Open |
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