Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/433113
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dc.coverage.spatial
dc.date.accessioned2022-12-28T12:26:04Z-
dc.date.available2022-12-28T12:26:04Z-
dc.identifier.urihttp://hdl.handle.net/10603/433113-
dc.description.abstractAttached
dc.format.extentxvi, 78p.
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleSome Investigations on Efficient Testing Fault Diagnosis Algorithms for VLSI Circuits
dc.title.alternativeSome Investigations on Efficient Testing and Fault Diagnosis Algorithms for VLSI Circuits
dc.creator.researcherRayudu, K V B V
dc.subject.keywordEfficient Testing
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.subject.keywordFault Diagnosis
dc.subject.keywordVLSI Circuits
dc.description.note
dc.contributor.guideRao, P Sreehari and Jahagirdar, D R
dc.publisher.placeWarangal
dc.publisher.universityNational Institute of Technology Warangal
dc.publisher.institutionDepartment of Electronics and Communication Engineering
dc.date.registered
dc.date.completed2022
dc.date.awarded2022
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronics and Communication Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File98.62 kBAdobe PDFView/Open
02_declaration.pdf52.02 kBAdobe PDFView/Open
03_certificate.pdf61.6 kBAdobe PDFView/Open
04_acknowledgement.pdf53.74 kBAdobe PDFView/Open
05_abstract.pdf69.8 kBAdobe PDFView/Open
06_content.pdf53.24 kBAdobe PDFView/Open
07_list of tables and figures.pdf67.8 kBAdobe PDFView/Open
08_abbreviations.pdf79.11 kBAdobe PDFView/Open
09_chapter 1.pdf61.72 kBAdobe PDFView/Open
10_chapter 2.pdf341.03 kBAdobe PDFView/Open
11_chapter 3.pdf1.67 MBAdobe PDFView/Open
12_chapter 4.pdf3.24 MBAdobe PDFView/Open
13_chapter 5.pdf65.93 kBAdobe PDFView/Open
14_bibliography.pdf132.8 kBAdobe PDFView/Open
80_recommendation.pdf149.69 kBAdobe PDFView/Open


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