1. Shodhganga@INFLIBNET
  2. Indian Institute of Technology Delhi
  3. Department of Electrical Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/428581
Title: Investigation of cmos scaling effects on hot carrier reliability through on wafer device characterization
Researcher: Gupta, Charu
Guide(s): Dixit, Abhisek
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Delhi
Completed Date: 2020
Abstract: Abstract Available
Pagination: 
URI: http://hdl.handle.net/10603/428581
Appears in Departments:Department of Electrical Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File151.45 kBAdobe PDFView/Open
02_prelim pages.pdf3.3 MBAdobe PDFView/Open
03_content.pdf494.94 kBAdobe PDFView/Open
04_abstract.pdf737.96 kBAdobe PDFView/Open
05_chapter 1.pdf6.41 MBAdobe PDFView/Open
06_chapter 2.pdf7.97 MBAdobe PDFView/Open
07_chapter 3.pdf9.32 MBAdobe PDFView/Open
08_chapter 4.pdf6.98 MBAdobe PDFView/Open
09_chapter 5.pdf4.74 MBAdobe PDFView/Open
10_chapter 6.pdf4.84 MBAdobe PDFView/Open
11_chapter 7.pdf5.72 MBAdobe PDFView/Open
12_chapter 8.pdf945.52 kBAdobe PDFView/Open
13_annexures.pdf5.38 MBAdobe PDFView/Open
80_recommendation.pdf1 MBAdobe PDFView/Open
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