Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/426205
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dc.coverage.spatial
dc.date.accessioned2022-12-17T08:33:51Z-
dc.date.available2022-12-17T08:33:51Z-
dc.identifier.urihttp://hdl.handle.net/10603/426205-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleAn Effective and Reliable Testing Method for Nano Resistive Random Access Memory RRAM
dc.title.alternativeAn Effective and Reliable Testing Method for Nano Resistive Random Access Memory RRAM
dc.creator.researcherH. Sribhuvaneswari
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.description.note
dc.contributor.guideK. Suthendran
dc.publisher.placeVirudhunagar
dc.publisher.universityKalasalingam University
dc.publisher.institutionDepartment of Electronics and Communication Engineering
dc.date.registered2016
dc.date.completed2022
dc.date.awarded2022
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronics and Communication Engineering

Files in This Item:
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01_title.pdf.pdfAttached File116.54 kBAdobe PDFView/Open
02_prelim pages.pdf.pdf1.55 MBAdobe PDFView/Open
03_content.pdf528.17 kBAdobe PDFView/Open
04_abstract.pdf.pdf125.09 kBAdobe PDFView/Open
05_chapter 1.pdf.pdf607.39 kBAdobe PDFView/Open
06_chapter 2.pdf.pdf572.49 kBAdobe PDFView/Open
07_chapter 3.pdf.pdf307.75 kBAdobe PDFView/Open
08_chapter 4.pdf.pdf488.16 kBAdobe PDFView/Open
09_chapter 5.pdf.pdf271.5 kBAdobe PDFView/Open
10_annectures.pdf.pdf346.35 kBAdobe PDFView/Open
11_chapter 6.pdf.pdf1.1 MBAdobe PDFView/Open
12_chapter 7.pdf.pdf1.03 MBAdobe PDFView/Open
13_chapter 8.pdf.pdf1.13 MBAdobe PDFView/Open
80_recommendation.pdf460.91 kBAdobe PDFView/Open


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