Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/425599
Title: Electro thermal Transport through Graphene and CNT at Nanosecond Time Scales and its Implications on Device Reliability
Researcher: Mishtra, Abhishek
Guide(s): Shrivastava, Mayank
Keywords: Multidisciplinary
Nanoscience and Nanotechnology
Physical Sciences
University: Indian Institute of Science Bangalore
Completed Date: 2019
URI: http://hdl.handle.net/10603/425599
Appears in Departments:Centre for Nano Science and Engineering

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01_title.pdfAttached File246.5 kBAdobe PDFView/Open
02_premlim pages.pdf76.38 kBAdobe PDFView/Open
03_abstract.pdf329.35 kBAdobe PDFView/Open
04_table of content.pdf74.37 kBAdobe PDFView/Open
05_chapter 1.pdf13.02 MBAdobe PDFView/Open
06_chapter 2.pdf9.18 MBAdobe PDFView/Open
07_chapter 3.pdf2.44 MBAdobe PDFView/Open
08_chapter 4.pdf9.89 MBAdobe PDFView/Open
09_chapter 5.pdf2.02 MBAdobe PDFView/Open
10_chapter 6.pdf1.78 MBAdobe PDFView/Open
11_chapter 7.pdf857.43 kBAdobe PDFView/Open
12_annexure.pdf92.88 kBAdobe PDFView/Open
80_recommendation.pdf402.01 kBAdobe PDFView/Open
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