Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/424982
Title: Modeling Analysis and Physics of Threshold Voltage Variation for Advanced Nano MOSFETs
Researcher: Swami, Yashu
Guide(s): Rai, Sanjeev
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Motilal Nehru National Institute of Technology
Completed Date: 2019
Pagination: i;242p.
URI: http://hdl.handle.net/10603/424982
Appears in Departments:Department of Electronics and Communication Engineering

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80_recommendation.pdfAttached File5.9 MBAdobe PDFView/Open
annexures.pdf836.1 kBAdobe PDFView/Open
chapter_1.pdf674.45 kBAdobe PDFView/Open
chapter_2.pdf692.54 kBAdobe PDFView/Open
chapter_3.pdf2.04 MBAdobe PDFView/Open
chapter_4.pdf0 BAdobe PDFView/Open
chapter_5.pdf1.46 MBAdobe PDFView/Open
chapter_6.pdf1.15 MBAdobe PDFView/Open
chapter_7.pdf297.04 kBAdobe PDFView/Open
contents.pdf379.16 kBAdobe PDFView/Open
prelim pages.pdf1.43 MBAdobe PDFView/Open
synopsis.pdf301.55 kBAdobe PDFView/Open
title page.pdf41.8 kBAdobe PDFView/Open
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