Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/422127
Title: Modeling of MOSFET under Illumination for Optoelectronic Applications
Researcher: Jain Prerana Narendra
Guide(s): Mishra B.K.
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
MOSFET
University: Narsee Monjee Institute of Management Studies
Completed Date: 2013
Abstract: Monolithic integration of optics with Silicon electronics is essential to realize low cost and high performance interconnections. In this thesis, the focus of work was the development of a photodetector in standard CMOS process, to interact with light at a wavelength of 830 nm. An n-channel silicon MOSFET was chosen which would offer detection along with an inherent advantage of gain in a combined package. Thus the study of light-effect on MOSFET is important specifically at a wavelength of 830 nm. newlineThe thesis presents a detailed theoretical investigation of n-channel silicon MOSFET with multi-finger structure suitable at RF under varying optical illumination. The results of the study show that there is an increase in current with increase in illumination under AC and DC conditions. The change in parameters can be accounted for the alteration of the threshold voltage and hence the effective gate voltage of the device due to absorption of optical flux. Hence this device is referred as OG-MOSFET i.e. Optically Gated MOSFET. newlineA small signal model was developed to accommodate the secondary effects in the submicron dimension device. The variations in transconductances and capacitances with variations in voltage and light were evaluated, and signify the potential of the device as an optically controlled mixer. The device transconductance is found to have substantial increase with other admittance parameters remaining almost constant under illumination. Power gain analysis, figures of merit and noise performance indicate that the device will be useful as optically controlled amplifiers for high frequency operation. newlineIt has been shown for the first time that the conventional MOSFET structure in standard CMOS process is a promising candidate that can be used for detection at 830 nm wavelengths.
Pagination: i-xiv;168
URI: http://hdl.handle.net/10603/422127
Appears in Departments:Department of Electronic Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File38.01 kBAdobe PDFView/Open
02_preliminary pages.pdf447 kBAdobe PDFView/Open
03_content.pdf91.22 kBAdobe PDFView/Open
04_abstract.pdf8.36 kBAdobe PDFView/Open
06_chapter_02.pdf310.76 kBAdobe PDFView/Open
08_chapter_04.pdf436.67 kBAdobe PDFView/Open
09_chapter_05.pdf885.68 kBAdobe PDFView/Open
10_chapter_06.pdf360.34 kBAdobe PDFView/Open
13_annexures.pdf354.17 kBAdobe PDFView/Open
80_recommendation.pdf14.4 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: