Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/421802
Title: Tcad based modelling of line edge roughness and radiation effects in advanced cmos devices
Researcher: Jha, Chandan Kumar
Guide(s): Dixit, Abhisek
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Delhi
Completed Date: 2021
Abstract: Abstract Available
Pagination: 
URI: http://hdl.handle.net/10603/421802
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File201.48 kBAdobe PDFView/Open
02_prelim pages.pdf398.88 kBAdobe PDFView/Open
03_content.pdf120.53 kBAdobe PDFView/Open
04_abstract.pdf87.68 kBAdobe PDFView/Open
05_chapter 1.pdf1.31 MBAdobe PDFView/Open
06_chapter 2.pdf1.49 MBAdobe PDFView/Open
07_chapter 3.pdf1.19 MBAdobe PDFView/Open
08_chapter 4.pdf762.16 kBAdobe PDFView/Open
09_chapter 5.pdf1.92 MBAdobe PDFView/Open
10_chapter 6.pdf207.97 kBAdobe PDFView/Open
11_annexures.pdf583.56 kBAdobe PDFView/Open
80_recommendation.pdf223.92 kBAdobe PDFView/Open
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