Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/421619
Title: Modeling and Characterization of Radiation Effects in CMOS Devices and Circuits
Researcher: Kritika Aditya
Guide(s): Dixit, Abhisek
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Indian Institute of Technology Delhi
Completed Date: 2021
Abstract: 
Pagination: 
URI: http://hdl.handle.net/10603/421619
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File329.53 kBAdobe PDFView/Open
02_dedication.pdf1.27 MBAdobe PDFView/Open
05_abstract.pdf484.14 kBAdobe PDFView/Open
06_content.pdf340.75 kBAdobe PDFView/Open
09_chapter 1.pdf874.44 kBAdobe PDFView/Open
10_chapter 2.pdf2.91 MBAdobe PDFView/Open
11_chapter 3.pdf1.08 MBAdobe PDFView/Open
12_chapter 4.pdf1.64 MBAdobe PDFView/Open
13_chapter 5.pdf1.1 MBAdobe PDFView/Open
14_chapter 6.pdf2.73 MBAdobe PDFView/Open
15_chapter 7.pdf400.17 kBAdobe PDFView/Open
16_appendix.pdf478.41 kBAdobe PDFView/Open
17_list of publications.pdf937.67 kBAdobe PDFView/Open
80_recommendation.pdf707.03 kBAdobe PDFView/Open
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