1. Shodhganga@INFLIBNET
  2. Annamalai University
  3. Department of Electronics & Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/421198
Title: architectural evaluation of built in self test and repair for content addressable memory
Researcher: Murugeswaran S
Guide(s): Yamuna G
Keywords: Engineering and Technology
Engineering
Engineering Electrical and Electronic
University: Annamalai University
Completed Date: 2022
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/421198
Appears in Departments:Department of Electronics & Communication Engineering

Files in This Item:
File Description SizeFormat 
10. chapter 3.pdfAttached File444.55 kBAdobe PDFView/Open
11. chapter 4.pdf570.62 kBAdobe PDFView/Open
12. chapter 5.pdf590.68 kBAdobe PDFView/Open
13. chapter 6.pdf740.14 kBAdobe PDFView/Open
14. chapter 7.pdf189.94 kBAdobe PDFView/Open
15. references.pdf211.74 kBAdobe PDFView/Open
16. list of publications.pdf264.35 kBAdobe PDFView/Open
1. title.pdf10.17 kBAdobe PDFView/Open
2. declaration.pdf152.24 kBAdobe PDFView/Open
3. certificate.pdf280.66 kBAdobe PDFView/Open
4. acknowledgement.pdf149.74 kBAdobe PDFView/Open
5. content.pdf94.13 kBAdobe PDFView/Open
6. list of graphs and tables.pdf93.52 kBAdobe PDFView/Open
7. abstract.pdf90.24 kBAdobe PDFView/Open
80_recommendation.pdf189.94 kBAdobe PDFView/Open
8. chapter 1.pdf398.94 kBAdobe PDFView/Open
9. chapter 2.pdf273.93 kBAdobe PDFView/Open
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