Power and Temperature Aware Circuit Testing

Abstract

The rapid increase in complexity of VLSI circuits along with their proliferation in new domains has posed new design and test challenges to the VLSI industry. Different metrics such as fault coverage, power and temperature have great impact during testing of a VLSI circuit. Obviously there exists some trade-offs among these metrics. During testing, care must be taken for higher fault coverage with low power consumption. These issues of digital, analog and mixed-signal circuits are considered in this thesis.