Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/420736
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dc.coverage.spatialPhysics
dc.date.accessioned2022-11-28T09:35:28Z-
dc.date.available2022-11-28T09:35:28Z-
dc.identifier.urihttp://hdl.handle.net/10603/420736-
dc.description.abstractIn this thesis a novel grating array based wavefront sensing GAWS scheme is proposed and demonstrated experimentally which can be used to measure both the thickness and surface profiles of the thin films simultaneously as a function of time during the growth process of the film This scheme does not require any prior information on the properties of the substrate and target material provided both the substrate and film are reflecting We use a grating array based wavefront sensor GAWS asse...
dc.format.extentNot Available
dc.languageEnglish
dc.relationNot Available
dc.rightsself
dc.titleDevelopment of grating array based zonal wavefront sensor for in situ surface profiling during the growth of the thin film in a deposition system
dc.title.alternativeNot available
dc.creator.researcherKumar, Nagendra
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.description.noteNot Available
dc.contributor.guideBoruah, Bosanta Ranjan and Khare, Alika
dc.publisher.placeGuwahati
dc.publisher.universityIndian Institute of Technology Guwahati
dc.publisher.institutionDEPARTMENT OF PHYSICS
dc.date.registered2015
dc.date.completed2022
dc.date.awarded2022
dc.format.dimensionsNot Available
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:DEPARTMENT OF PHYSICS

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