Pulsed laser deposited indium tin oxide and its indium rich composite thin films as efficient material platforms for probing epsilon near zero plasmon and lossy mode resonance via kretschmann raether geometry

Abstract

In the present thesis work epsilon near zero ENZ plasmon resonance and lossy mode resonance LMR properties of pulsed laser deposited indium tin oxide ITO thin films and metallic indium rich ITO thin films are studied experimentally with the help of Kretschmann 226 8364 8220 Raether geometry Wide tuning of the ENZ wavelength over the wavelength range of 900 226 8364 8220 1700 nm is achieved for ITO thin films deposited under background gases such as O2 N2 Ar and He The variation of ENZ plasmon resonance pos newline...