Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/408399
Title: Ion Beam Studies of Pure and Nanoparticle Si Ag Embedded HfO2 Thin Films
Researcher: Dhanunjaya ,Munthala
Guide(s): Rao ,S. V. S. Nageswara and Pathak A. P.
Keywords: Embedded computer systems
Nanoparticles
Physical Sciences
Physics
Physics Applied
University: University of Hyderabad
Completed Date: 2018
Abstract: 
Pagination: 147p.
URI: http://hdl.handle.net/10603/408399
Appears in Departments:School of Physics

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01_title.pdfAttached File225.24 kBAdobe PDFView/Open
02_declaration.pdf245.03 kBAdobe PDFView/Open
03_certificate.pdf556.89 kBAdobe PDFView/Open
04_acknowledgement.pdf262.74 kBAdobe PDFView/Open
05_glossary.pdf262.91 kBAdobe PDFView/Open
06_table of content.pdf159.9 kBAdobe PDFView/Open
07_abstract.pdf261.99 kBAdobe PDFView/Open
08_chapter 1.pdf1.05 MBAdobe PDFView/Open
09_chapter 2.pdf1.45 MBAdobe PDFView/Open
10_chapter 3.pdf2.34 MBAdobe PDFView/Open
11_chapter 4.pdf1.96 MBAdobe PDFView/Open
12_chapter 5.pdf1.7 MBAdobe PDFView/Open
13_chapter 6.pdf2.94 MBAdobe PDFView/Open
14_list of publications.pdf346.51 kBAdobe PDFView/Open
80_recommendation.pdf373.94 kBAdobe PDFView/Open
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