Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/40662
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dc.coverage.spatialImproved algorithms for test suite Reduction in data flow testingen_US
dc.date.accessioned2015-05-09T07:13:20Z-
dc.date.available2015-05-09T07:13:20Z-
dc.date.issued2015-05-09-
dc.identifier.urihttp://hdl.handle.net/10603/40662-
dc.description.abstractnewlineLeading edge technologies demand software to be built on a solid newlinefoundation of requirements development processes project management newlinemethodologies and quality practices Such software intensive systems demand newlinehigh quality product However it is estimated that software developers newlineapproximately spend half of the development cost and time on testing to newlinerelease a quality product Better software testing practices can cut down the newlinecost incurred to develop quality products and also avert software failures This newlineleads to focusing on proper test optimization techniques Test suite reduction newlineis one such technique that addresses the problem of optimizing test suites In newlinethis presented work different test suite reduction algorithms have been newlineproposed for optimizing test suites newlineThe details of literature study also reveal that most of the proposed newlinetest suite reduction approaches focus only on the test metric considering the newlinetest suite size In this work attempts have been made to construct optimal test newlinesuites for testing software using four different algorithms These algorithms newlinealso investigate the effectiveness of some notable test metrics while newlineoptimizing the test suites newlineThe concept of Bee Colony Optimization approach has been newlineproposed as Adapted Bee Colony Test Suite Reduction ABC TSR algorithm newline newlineen_US
dc.format.extentxxi, 172p.en_US
dc.languageEnglishen_US
dc.relationp161-171.en_US
dc.rightsuniversityen_US
dc.titleImproved algorithms for test suite Reduction in data flow testingen_US
dc.title.alternativeen_US
dc.creator.researcherPreethi harrisen_US
dc.subject.keywordAdapted Bee Colony Test Suite Reductionen_US
dc.subject.keywordBee Colony Optimizationen_US
dc.description.noteappendix p144-160, reference p161-171.en_US
dc.contributor.guideNedunchezian Ren_US
dc.publisher.placeChennaien_US
dc.publisher.universityAnna Universityen_US
dc.publisher.institutionFaculty of Information and Communication Engineeringen_US
dc.date.registeredn.d,en_US
dc.date.completed01/04/2014en_US
dc.date.awarded30/04/2014en_US
dc.format.dimensions23cm.en_US
dc.format.accompanyingmaterialNoneen_US
dc.source.universityUniversityen_US
dc.type.degreePh.D.en_US
Appears in Departments:Faculty of Information and Communication Engineering

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01_title.pdfAttached File16.56 kBAdobe PDFView/Open
02_certificate.pdf1.65 MBAdobe PDFView/Open
03_abstract.pdf10.29 kBAdobe PDFView/Open
04_acknowledgement.pdf6.08 kBAdobe PDFView/Open
05_content.pdf25.78 kBAdobe PDFView/Open
06_chapter1.pdf203.58 kBAdobe PDFView/Open
07_chapter2.pdf143.22 kBAdobe PDFView/Open
08_chapter3.pdf33.79 kBAdobe PDFView/Open
09_chapter4.pdf343.16 kBAdobe PDFView/Open
10_chapter5.pdf180.4 kBAdobe PDFView/Open
11_chapter6.pdf194.05 kBAdobe PDFView/Open
12_chapter7.pdf8.46 kBAdobe PDFView/Open
13_appendix.pdf114.96 kBAdobe PDFView/Open
14_reference.pdf398.62 kBAdobe PDFView/Open
15_publication.pdf25.33 kBAdobe PDFView/Open


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