Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/404342
Title: Study of semiconductor material using dft and tcad simulation of nano scale gaafet devices a
Researcher: Bhoop , Singh
Guide(s): B, Prasad and Dinesh kumar
Keywords: Engineering and Technology
Material accountability
Material Science
Materials Science Biomaterials
Semiconductor doping
Semiconductors--Defects
University: Kurukshetra University
Completed Date: 2021
Abstract: 
Pagination: 267 p.
URI: http://hdl.handle.net/10603/404342
Appears in Departments:Department of Electronic Sc.

Files in This Item:
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10_chapter-1.pdfAttached File2.16 MBAdobe PDFView/Open
11_chapter- 2.pdf1.15 MBAdobe PDFView/Open
12_chapter- 3.pdf2.36 MBAdobe PDFView/Open
13_chapter- 4.pdf1.79 MBAdobe PDFView/Open
14_chapter- 5.pdf1.48 MBAdobe PDFView/Open
15_chapter- 6.pdf2.26 MBAdobe PDFView/Open
16_publications.pdf613.55 kBAdobe PDFView/Open
1_title_page.pdf238.42 kBAdobe PDFView/Open
2_supervisors _certificate.pdf251.23 kBAdobe PDFView/Open
3_candidate declaration.pdf514.02 kBAdobe PDFView/Open
4_acknowledgments.pdf441.88 kBAdobe PDFView/Open
5_abstract.pdf501.56 kBAdobe PDFView/Open
6_table of contents.pdf547.73 kBAdobe PDFView/Open
7_list of figures.pdf531.18 kBAdobe PDFView/Open
80_recommendation.pdf780.22 kBAdobe PDFView/Open
8_list of tables.pdf481.79 kBAdobe PDFView/Open
9_abbreviations.pdf501.3 kBAdobe PDFView/Open
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