1. Shodhganga@INFLIBNET
  2. Indian Institute of Technology Madras
  3. Physics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/401729
Title: Capacitance based assessment of dielectric permittivity scaling relations non contact mapping of extended media
Researcher: Gokul Raj R
Guide(s): C. V. Krishnamurthy
Keywords: Physical Sciences
Physics
University: Indian Institute of Technology Madras
Completed Date: 2021
Abstract: newline AVAILABLE
Pagination: xxi, 146p
URI: http://hdl.handle.net/10603/401729
Appears in Departments:Physics

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01_title.pdfAttached File153.49 kBAdobe PDFView/Open
03_certificate.pdf140.9 kBAdobe PDFView/Open
04_ acknowledgement.pdf35.11 kBAdobe PDFView/Open
05_content.pdf76.26 kBAdobe PDFView/Open
06_list of graph and table.pdf107.32 kBAdobe PDFView/Open
07_abstract.pdf64.07 kBAdobe PDFView/Open
08_chapter 1.pdf217.49 kBAdobe PDFView/Open
09_chapter 2.pdf1.34 MBAdobe PDFView/Open
10_chapter 3.pdf2.93 MBAdobe PDFView/Open
11_chapter 4.pdf1.87 MBAdobe PDFView/Open
12_chapter 5.pdf3.09 MBAdobe PDFView/Open
13_chapter 6.pdf86.31 kBAdobe PDFView/Open
14_ bibliography.pdf85.08 kBAdobe PDFView/Open
15_publication.pdf31.19 kBAdobe PDFView/Open
16_abbrevations and notation.pdf64.4 kBAdobe PDFView/Open
17_curriculum vitae.pdf21.23 kBAdobe PDFView/Open
18_doctoral committee.pdf20.46 kBAdobe PDFView/Open
80_recommendation.pdf212.27 kBAdobe PDFView/Open
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