Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/401260
Title: Modeling Analysis and Study of Self Heating Effect on Selective Buried Oxide Junction less Transistor
Researcher: Amrish Kumar
Guide(s): Rai, Sanjeev
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Motilal Nehru National Institute of Technology
Completed Date: 2021
Abstract: Available newline
Pagination: 155p.
URI: http://hdl.handle.net/10603/401260
Appears in Departments:Department of Electronics and Communication Engineering

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80_recommendation.pdfAttached File2.76 MBAdobe PDFView/Open
acknowledgements.pdf174.45 kBAdobe PDFView/Open
biography.pdf218.97 kBAdobe PDFView/Open
certificate.pdf198.92 kBAdobe PDFView/Open
chapter_1.pdf246.61 kBAdobe PDFView/Open
chapter_2.pdf1.35 MBAdobe PDFView/Open
chapter_3.pdf676.38 kBAdobe PDFView/Open
chapter_4.pdf661.01 kBAdobe PDFView/Open
chapter_5.pdf660.75 kBAdobe PDFView/Open
chapter_6.pdf835.81 kBAdobe PDFView/Open
chapter_7.pdf301.56 kBAdobe PDFView/Open
list of figures, tables and abbreviations.pdf460.36 kBAdobe PDFView/Open
list of publications.pdf300.84 kBAdobe PDFView/Open
references.pdf459.89 kBAdobe PDFView/Open
synopsis.pdf360.39 kBAdobe PDFView/Open
table of contents.pdf288.2 kBAdobe PDFView/Open
title page.pdf261.56 kBAdobe PDFView/Open
undertaking.pdf216.69 kBAdobe PDFView/Open
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