Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/400084
Title: Design and Analysis of Reliability Aware CMOS Circuits for a Neuromorphic System
Researcher: Babu, Shaik Jani
Guide(s): Singhal, Sonal
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Shiv Nadar University
Completed Date: 2021
Abstract: The current study proposes the implementation of SLIFMEM, a neuromorphic system newlineconsisting of programmable synaptic memory and neural core blocks. The SLIFMEM is newlineimplemented with SRAM as synaptic memory of size 1024 with 5-bits word. The SLIFMEM newlineneural core consists of DPI based SiS, and SLIF neuron. The present work also implement the newlinereliability-aware SLIFMEM, referred to as rel-SLIFMEM, which is developed by replacing SLIF newlineSiN with rel-SLIF SiN in its neural core. The impact of BTI and HCI on the performance of the newlinerel-SLIFMEM is analyzed using a key performance metric, inter-spike interval. The performance newlineof rel-SLIFMEM is compared with the conventional SLIFMEM. Finally, the energy consumption newlineof rel-SLIFMEM is examined at time-zero and compared with conv-SLIFMEM.
Pagination: 
URI: http://hdl.handle.net/10603/400084
Appears in Departments:Department Of Electrical Engineering

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abstract.pdf101 kBAdobe PDFView/Open
acknowledgement.pdf106 kBAdobe PDFView/Open
bibliography.pdf238.53 kBAdobe PDFView/Open
certificate.pdf75.16 kBAdobe PDFView/Open
chapter-1.pdf162.34 kBAdobe PDFView/Open
chapter-2.pdf421.07 kBAdobe PDFView/Open
chapter-3.pdf2.91 MBAdobe PDFView/Open
chapter-4.pdf575.32 kBAdobe PDFView/Open
chapter-5.pdf360.09 kBAdobe PDFView/Open
chapter-6.pdf154.32 kBAdobe PDFView/Open
content.pdf132.94 kBAdobe PDFView/Open
declaration.pdf144.14 kBAdobe PDFView/Open
list of figures and tables.pdf194.17 kBAdobe PDFView/Open
title page.pdf48.25 kBAdobe PDFView/Open
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