Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/394428
Title: Study Of Advanced Methods For Reliability Analysis Of Digital I and C Systems
Researcher: SHUKLA DARPAN KRISHNAKUMAR
Guide(s): A John Arul
Keywords: Automatic PN generation
Decay heat removal system
Dynamic Reliability analysis
Hierarchy identification
Monte Carlo simulation
Near system representation
Nonhomogeneous Markov model
Petri net voting model
Shutdown system reliability
Smart component method
University: Homi Bhabha National Institute
Completed Date: 2022
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/394428
Appears in Departments:Department of Engineering Sciences

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01_title.pdfAttached File121.72 kBAdobe PDFView/Open
02_declaration.pdf315.92 kBAdobe PDFView/Open
03_certificate.pdf1.32 MBAdobe PDFView/Open
04_acknowledgement.pdf315.92 kBAdobe PDFView/Open
05_content.pdf134.21 kBAdobe PDFView/Open
06_list_of_graph_and_table.pdf176.16 kBAdobe PDFView/Open
07_abstract.pdf164.54 kBAdobe PDFView/Open
08_chapter_1.pdf349.95 kBAdobe PDFView/Open
09_chapter_2.pdf621.13 kBAdobe PDFView/Open
10_chapter_3.pdf982.82 kBAdobe PDFView/Open
11_chapter_4.pdf1.81 MBAdobe PDFView/Open
12_chapter_5.pdf3.23 MBAdobe PDFView/Open
13_chapter_6.pdf2.18 MBAdobe PDFView/Open
20_synopsis.pdf104.04 kBAdobe PDFView/Open
21_other_info.pdf3.61 MBAdobe PDFView/Open
22_highlights.pdf791.33 kBAdobe PDFView/Open
80_recommendation.pdf121.72 kBAdobe PDFView/Open
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