1. Shodhganga@INFLIBNET
  2. Homi Bhabha National Institute
  3. Department of Engineering Sciences
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/391332
Title: Study Of Advanced Methods For Reliability Analysis Of Digital I and C Systems
Researcher: SHUKLA DARPAN KRISHNAKUMAR
Guide(s): M K Samal
Keywords: Activation energy
Crystal plasticity
Dislocation dynamics
Dislocation nucleation
Grain boundary
Hall-Petch effect
Molecular dynamics
Ni-based alloy
Nudged elastic band method
Texture
University: Homi Bhabha National Institute
Completed Date: 2022
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/391332
Appears in Departments:Department of Engineering Sciences

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01_title.pdfAttached File46.44 kBAdobe PDFView/Open
02_declaration.pdf458.03 kBAdobe PDFView/Open
03_certificate.pdf146.32 kBAdobe PDFView/Open
04_acknowledgement.pdf458.03 kBAdobe PDFView/Open
05_content.pdf92.71 kBAdobe PDFView/Open
06_list_of_graph_and_table.pdf224.29 kBAdobe PDFView/Open
07_abstract.pdf100.5 kBAdobe PDFView/Open
08_chapter_1.pdf67.92 kBAdobe PDFView/Open
09_chapter_2.pdf129.01 kBAdobe PDFView/Open
10_chapter_3.pdf1.11 MBAdobe PDFView/Open
11_chapter_4.pdf1.59 MBAdobe PDFView/Open
12_chapter_5.pdf1.19 MBAdobe PDFView/Open
13_chapter_6.pdf3.19 MBAdobe PDFView/Open
14_chapter_7.pdf2.13 MBAdobe PDFView/Open
15_chapter_8.pdf100.5 kBAdobe PDFView/Open
20_synopsis.pdf52.09 kBAdobe PDFView/Open
21_other_info.pdf139.94 kBAdobe PDFView/Open
22_highlights.pdf255.7 kBAdobe PDFView/Open
80_recommendation.pdf46.44 kBAdobe PDFView/Open
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