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http://hdl.handle.net/10603/38300
Title: | Synthesis and characterization of Yttria stabilized zirconia and Zirconium tin titanate |
Researcher: | Ganesh babu P |
Guide(s): | Manohar P |
Keywords: | 8 mol Yttria Stabilized Zirconia Nanoindentation Zirconium Tin Titanate |
Upload Date: | 31-Mar-2015 |
University: | Anna University |
Completed Date: | 01/10/2014 |
Abstract: | In general nanoindentation was performed only for thin films and newlineCrystals The nanoindentation studies of the microwave sintered yttria newlinestabilized zirconia bulk sample has not been reported by previous newlineinvestigators This is an attempt to study the nano mechanical properties, newlinesuch as nanohardness and elastic modulus and one of the important newlinetribological property the coefficient of friction of the microwave sintered newline8 mol Yttria Stabilized Zirconia 8YSZ sample Nanocrystalline ceramic newlinematerials are characterized by distinctive electrical properties that are newlinedifferent from those of micro crystalline samples Generally the surface newlineatom of the nanomaterial will have a higher diffusion coefficient than that of newlinethe bulk ceramic material In the nano 8YSZ sample the electrical transport is newlinedominated by the grain boundary effect so that many inconsistent electrical newlineconductivity results are obtained The main reason for the poor electrical newlineconductivity is the densification of the sample If the conventional sintering newlinemethod is used a higher temperature produces more grain growth in the newlinemicrostructure and the sample will lose its nano properties hence we have to newlinefind alternative sintering methods So the microwave sintering technique is newlinepreferred to enhance the electrical conductivity The total conductivity is newlinedetermined from the Arrhenius representation The activation energy can be newlineobtained from the slope of the fitted line Recently great attention has been newlinepaid to Zirconium Tin Titanate ZST for its low dielectric loss and high newlinedielectric constant high quality factor an almost zero temperature coefficient newlineand strong temperature stability leading to its specific applications in devices newline newline |
Pagination: | xxii, 159p. |
URI: | http://hdl.handle.net/10603/38300 |
Appears in Departments: | Faculty of Science and Humanities |
Files in This Item:
File | Description | Size | Format | |
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01_title.pdf | Attached File | 25.28 kB | Adobe PDF | View/Open |
02_certificate.pdf | 1.09 MB | Adobe PDF | View/Open | |
03_abstract.pdf | 52.14 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 461.3 kB | Adobe PDF | View/Open | |
05_content.pdf | 61.78 kB | Adobe PDF | View/Open | |
06_chapter1.pdf | 731.98 kB | Adobe PDF | View/Open | |
07_chapter2.pdf | 1.23 MB | Adobe PDF | View/Open | |
08_cahpter3.pdf | 272.95 kB | Adobe PDF | View/Open | |
09_chapter4.pdf | 522.92 kB | Adobe PDF | View/Open | |
10_chapter5.pdf | 1.27 MB | Adobe PDF | View/Open | |
11_chapter6.pdf | 327.08 kB | Adobe PDF | View/Open | |
12_chapter7.pdf | 12.94 kB | Adobe PDF | View/Open | |
13_reference.pdf | 48.71 kB | Adobe PDF | View/Open | |
14_publication.pdf | 5.67 kB | Adobe PDF | View/Open |
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