Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/370862
Full metadata record
DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2022-03-30T10:10:11Z-
dc.date.available2022-03-30T10:10:11Z-
dc.identifier.urihttp://hdl.handle.net/10603/370862-
dc.description.abstractAvailable newline
dc.format.extent293 p.
dc.languageEnglish
dc.relationBibliography 277-285 p.
dc.rightsuniversity
dc.titlePredicting probability of debt default a study of corporate debt market in India and other countries
dc.title.alternative
dc.creator.researcherUpadhyay, Rajeev Kumar
dc.subject.keywordBusiness
dc.subject.keywordEconomics and Business
dc.subject.keywordSocial Sciences
dc.description.note293 p.
dc.contributor.guideSharma, Chandra Shekhar and Singh, R K
dc.publisher.placeNew Delhi
dc.publisher.universityUniversity of Delhi
dc.publisher.institutionDept. of Commerce
dc.date.registered
dc.date.completed2018
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Dept. of Commerce

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File69.21 kBAdobe PDFView/Open
02_certificate.pdf244.29 kBAdobe PDFView/Open
03_declaration.pdf196.45 kBAdobe PDFView/Open
04_acknowledgement.pdf94.6 kBAdobe PDFView/Open
05_abstract.pdf107.71 kBAdobe PDFView/Open
06_table of content.pdf118.19 kBAdobe PDFView/Open
07_list of tables.pdf191.37 kBAdobe PDFView/Open
08_abbreviation.pdf108.79 kBAdobe PDFView/Open
09_chapter 1.pdf289.12 kBAdobe PDFView/Open
10_chapter 2.pdf249.61 kBAdobe PDFView/Open
11_chapter 3.pdf343.77 kBAdobe PDFView/Open
12_chapter 4.pdf391.48 kBAdobe PDFView/Open
13_chapter 5.pdf1.12 MBAdobe PDFView/Open
14_bibliography.pdf282.84 kBAdobe PDFView/Open
15_appendix.pdf373.07 kBAdobe PDFView/Open
80_recommendation.pdf325.34 kBAdobe PDFView/Open


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: