Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/370861
Title: Some optimumaccelerated degradation testing models in reliability
Researcher: Manisha
Guide(s): Srivastava, Preeti Wanti
Keywords: Computer Science
Engineering and Technology
Operations Research and Management Science
University: University of Delhi
Completed Date: 2018
Abstract: Available newline
Pagination: 185 p.
URI: http://hdl.handle.net/10603/370861
Appears in Departments:Dept. of Operational Research

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01_title.pdfAttached File6.38 kBAdobe PDFView/Open
02_certificate.pdf95.97 kBAdobe PDFView/Open
03_declaration.pdf8.2 kBAdobe PDFView/Open
04_acknowledgement.pdf10.67 kBAdobe PDFView/Open
05_abstract.pdf391.65 kBAdobe PDFView/Open
06_table of content.pdf22.09 kBAdobe PDFView/Open
07_list of tables and figures.pdf33.17 kBAdobe PDFView/Open
08_abbreviation.pdf8.82 kBAdobe PDFView/Open
09_chapter 1.pdf680.32 kBAdobe PDFView/Open
10_chapter 2.pdf421.54 kBAdobe PDFView/Open
11_chapter 3.pdf846.79 kBAdobe PDFView/Open
12_chapter 4.pdf649.81 kBAdobe PDFView/Open
13_chapter 5.pdf1.01 MBAdobe PDFView/Open
14_bibliography.pdf71.75 kBAdobe PDFView/Open
15_appendix.pdf15.8 kBAdobe PDFView/Open
16_annexture.pdf12.46 kBAdobe PDFView/Open
80_recommendation.pdf2.58 MBAdobe PDFView/Open
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