Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/369341
Title: Development of an efficient technique for detection of printed circuit board defects
Researcher: Beant Kaur
Guide(s): Gurmeet Kaur and Amandeep Kaur
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Punjabi University
Completed Date: 2018
Abstract: File attached newline
Pagination: xix, 131 p.
URI: http://hdl.handle.net/10603/369341
Appears in Departments:Department of Electronics and Communication Engineering

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10 chapter 2.pdfAttached File119.44 kBAdobe PDFView/Open
11 chapter 3.pdf396.01 kBAdobe PDFView/Open
12 chapter 4.pdf379.07 kBAdobe PDFView/Open
13 chapter 5.pdf359.83 kBAdobe PDFView/Open
14 chapter 6.pdf294.28 kBAdobe PDFView/Open
15 conclusion and future scope.pdf26.19 kBAdobe PDFView/Open
16 references.pdf158.25 kBAdobe PDFView/Open
17 annexure a.pdf231.71 kBAdobe PDFView/Open
18 list of publications.pdf58.1 kBAdobe PDFView/Open
1 title page.pdf2.6 MBAdobe PDFView/Open
2 certificate.pdf1.18 MBAdobe PDFView/Open
80_recommendation.pdf2.63 MBAdobe PDFView/Open
9 chapter 1.pdf143.68 kBAdobe PDFView/Open
abstract.pdf85.37 kBAdobe PDFView/Open
prelim.pdf7.39 MBAdobe PDFView/Open
punjabi abstract unicode.pdf254.45 kBAdobe PDFView/Open
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