Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/368791
Title: Liquid Film Thickness And Volumetric Void Fraction Measurement Using Ir Transceivers During Two Phase Flow
Researcher: Mithran N
Guide(s): Venkatesan M
Keywords: Engineering
Engineering and Technology
Engineering Mechanical
Liquid film thickness COMSCL
Tow Phase flow
University: SASTRA University
Completed Date: 2020
Abstract: Abstract Included newline
Pagination: xvii. 134p
URI: http://hdl.handle.net/10603/368791
Appears in Departments:School of Mechanical Engineering

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01_title.pdfAttached File180.45 kBAdobe PDFView/Open
02_certificate.pdf496.24 kBAdobe PDFView/Open
03_perliminaryr.pdf590.18 kBAdobe PDFView/Open
04_chapter_01.pdf313.31 kBAdobe PDFView/Open
05_chapter_02.pdf680.27 kBAdobe PDFView/Open
06_chapter_03.pdf855.46 kBAdobe PDFView/Open
07_chapter_04.pdf638.51 kBAdobe PDFView/Open
08_chapter_05_.pdf5.09 MBAdobe PDFView/Open
09_chapter_06.pdf187.65 kBAdobe PDFView/Open
10_references.pdf636.06 kBAdobe PDFView/Open
11_appendix.pdf517.78 kBAdobe PDFView/Open
80_recommendation.pdf366.93 kBAdobe PDFView/Open
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