Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/359571
Title: Preparation and Characterization Of Thin Film Multilayer Devices For Application In Water Window Regime Of Soft X Ray
Researcher: Piyali Sarkar Roy
Guide(s): D Bhattacharyya
Keywords: Diffuse Scattering
Grazing Incidence X-ray Ref.
Interface properties
Ion Beam Sputtering
Magnetron Sputtering
Multilayer Thin Film
Soft x-ray reflectivity
Water window regime
University: Homi Bhabha National Institute
Completed Date: 2022
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/359571
Appears in Departments:Department of Physical Sciences

Files in This Item:
File Description SizeFormat 
80_recommendation.pdfAttached File463.02 kBAdobe PDFView/Open
chp1_6561.pdf1.88 MBAdobe PDFView/Open
chp2_6561.pdf6.24 MBAdobe PDFView/Open
chp3_6561.pdf2.86 MBAdobe PDFView/Open
chp4_6561.pdf3.62 MBAdobe PDFView/Open
chp5_6561.pdf1.23 MBAdobe PDFView/Open
cntnt_6561.pdf27.13 kBAdobe PDFView/Open
cp_6561.pdf246.13 kBAdobe PDFView/Open
othr_inf_6561.pdf191.52 kBAdobe PDFView/Open
pp_6561.pdf588.58 kBAdobe PDFView/Open
smry_6561.pdf36.96 kBAdobe PDFView/Open
synp_6561.pdf226.5 kBAdobe PDFView/Open
tbl_fgr_6561.pdf2.16 MBAdobe PDFView/Open
ths_hglts_6561.pdf633.42 kBAdobe PDFView/Open
ttp_6561.pdf463.02 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: