Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/358355
Title: | Development of Test Power and Test Data Volume Reduction Methods in Digital VLSI Circuits |
Researcher: | Mitra, Sanjoy |
Guide(s): | Das, Debaprasad |
Keywords: | Computer Science Computer Science Software Engineering Engineering and Technology |
University: | Assam University |
Completed Date: | 2019 |
Abstract: | newline |
Pagination: | vi, 124p. |
URI: | http://hdl.handle.net/10603/358355 |
Appears in Departments: | Department of Computer Science and Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title page.pdf | Attached File | 66.52 kB | Adobe PDF | View/Open |
02_certificate.pdf | 58.15 kB | Adobe PDF | View/Open | |
03_preliminary pages.pdf | 954.08 kB | Adobe PDF | View/Open | |
04_abstract.pdf | 241.55 kB | Adobe PDF | View/Open | |
05_chapter 1.pdf | 2.09 MB | Adobe PDF | View/Open | |
06_chapter 2.pdf | 5.26 MB | Adobe PDF | View/Open | |
07_chapter 3.pdf | 5.84 MB | Adobe PDF | View/Open | |
08_chapter 4.pdf | 2.17 MB | Adobe PDF | View/Open | |
09_chapter 5.pdf | 3.75 MB | Adobe PDF | View/Open | |
10_chapter 6.pdf | 219.05 kB | Adobe PDF | View/Open | |
11_bibliography.pdf | 3.48 MB | Adobe PDF | View/Open | |
12_annexure i.pdf | 552.71 kB | Adobe PDF | View/Open | |
13_annexure ii.pdf | 711.61 kB | Adobe PDF | View/Open | |
14_annexure iii.pdf | 2.52 MB | Adobe PDF | View/Open | |
80_recommendation.pdf | 284.81 kB | Adobe PDF | View/Open |
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