Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/358079
Title: Signal Integrity Analysis of On Chip Interconnects Using MRTD
Researcher: Shashank, Rebelli
Guide(s): Rao, N. Bheema
Keywords: Engineering and Technology
Finite difference time domain
Multiresolution time domain
Mutually coupled interconnects
VLSI interconnects
University: National Institute of Technology (NIT), Warangal
Completed Date: 2019
Abstract: File Attached
Pagination: xvii, 100 p.
URI: http://hdl.handle.net/10603/358079
Appears in Departments:Department of Electronics and Communication Engineering

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File Description SizeFormat 
01_title.pdfAttached File72.63 kBAdobe PDFView/Open
02_declaration.pdf153.7 kBAdobe PDFView/Open
03_certificate.pdf116.16 kBAdobe PDFView/Open
04_acknowledgement.pdf275.88 kBAdobe PDFView/Open
05_abstract.pdf69.83 kBAdobe PDFView/Open
06_content.pdf383.14 kBAdobe PDFView/Open
07_list of tables and figures.pdf540.27 kBAdobe PDFView/Open
08_list of tables and figures.pdf224.02 kBAdobe PDFView/Open
09_abbreviations and symbols.pdf221.15 kBAdobe PDFView/Open
10_chapter 1.pdf3.49 MBAdobe PDFView/Open
11_chapter 2.pdf4.66 MBAdobe PDFView/Open
12_chapter 3.pdf3.77 MBAdobe PDFView/Open
13_chapter 4.pdf9.21 MBAdobe PDFView/Open
14-chapter 5.pdf3.82 MBAdobe PDFView/Open
15_chapter 6.pdf153.3 kBAdobe PDFView/Open
16_references.pdf2.93 MBAdobe PDFView/Open
80_recommendation.pdf207.19 kBAdobe PDFView/Open
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