1. Shodhganga@INFLIBNET
  2. Manipal Academy of Higher Education
  3. Manipal Institute of Technology
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/357040
Title: Development of novel reliability test method for evaluating lifetime behaviour of solid state lighting systems
Researcher: Padmasali, Anjan N
Guide(s): Kini, Savitha G
Keywords: Engineering Electrical and Electronic
light-emitting diode (LED)
novel reliability test method
University: Manipal Academy of Higher Education
Completed Date: 2020
Abstract: Available newline
Pagination: 169p.
URI: http://hdl.handle.net/10603/357040
Appears in Departments:Manipal Institute of Technology

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01_title.pdfAttached File154.59 kBAdobe PDFView/Open
02_declaration.pdf261.16 kBAdobe PDFView/Open
03_certificate.pdf295.22 kBAdobe PDFView/Open
04_acknowledgement.pdf51.55 kBAdobe PDFView/Open
05_contents.pdf72.64 kBAdobe PDFView/Open
06_list of tables.pdf93.46 kBAdobe PDFView/Open
07_list of figures.pdf87.91 kBAdobe PDFView/Open
08_abbreviations.pdf49.78 kBAdobe PDFView/Open
09_abstract.pdf50.15 kBAdobe PDFView/Open
10_chapter 1.pdf267.22 kBAdobe PDFView/Open
11_chapter 2.pdf139.74 kBAdobe PDFView/Open
12_chapter 3.pdf3.43 MBAdobe PDFView/Open
13_chapter 4.pdf3.1 MBAdobe PDFView/Open
14_chapter 5.pdf5.04 MBAdobe PDFView/Open
15_chapter 6.pdf2.31 MBAdobe PDFView/Open
16_summary.pdf120.08 kBAdobe PDFView/Open
17_bibliography.pdf106.45 kBAdobe PDFView/Open
80_recommendation.pdf239.64 kBAdobe PDFView/Open
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