Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/353732
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2021-12-31T08:48:57Z-
dc.date.available2021-12-31T08:48:57Z-
dc.identifier.urihttp://hdl.handle.net/10603/353732-
dc.description.abstractnewline
dc.format.extent163p.
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleStudies in design for testability techniques for stuck open and delay faults
dc.title.alternative
dc.creator.researcherHafizur Rahaman
dc.subject.keywordDelay Faults
dc.subject.keywordDesign
dc.subject.keywordTestability Techniques
dc.description.note
dc.contributor.guideDas, Debesh Kumar
dc.publisher.placeKolkata
dc.publisher.universityJadavpur University
dc.publisher.institutionDepartment of Computer Science and Engineering
dc.date.registered
dc.date.completed2002
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Computer Science and Engineering

Files in This Item:
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01_title page.pdfAttached File19.67 kBAdobe PDFView/Open
02_dedication.pdf10.43 kBAdobe PDFView/Open
03_acknowledgement.pdf39.86 kBAdobe PDFView/Open
04_certificate.pdf38.45 kBAdobe PDFView/Open
05_abstract.pdf80 kBAdobe PDFView/Open
06_contents.pdf136.86 kBAdobe PDFView/Open
07_chapter 1.pdf315.02 kBAdobe PDFView/Open
08_chapter 2.pdf908.54 kBAdobe PDFView/Open
09_chapter 3.pdf1.57 MBAdobe PDFView/Open
10_chapter 4.pdf439.3 kBAdobe PDFView/Open
11_chapter 5.pdf447.36 kBAdobe PDFView/Open
12_chapter 6.pdf649.42 kBAdobe PDFView/Open
13_chapter 7.pdf1.07 MBAdobe PDFView/Open
14_chapter 8.pdf108.13 kBAdobe PDFView/Open
15_bibliography.pdf1.69 MBAdobe PDFView/Open
16_list of publication.pdf47.14 kBAdobe PDFView/Open
80_recommendation.pdf93.49 kBAdobe PDFView/Open


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