1. Shodhganga@INFLIBNET
  2. International Institute of Information Technology Bangalore
  3. Department of Electronics and Systems Design
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/351268
Title: Parameter importance based methods for variation aware analog yield optimization
Researcher: Kondamadugula, Sita
Guide(s): Naidu, Srinath R
Keywords: Computer Science
Computer Science Hardware and Architecture
Engineering and Technology
University: International Institute of Information Technology Bangalore
Completed Date: 2019
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/351268
Appears in Departments:Department of Electronics and Systems Design

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File151.21 kBAdobe PDFView/Open
02_dedication.pdf21.44 kBAdobe PDFView/Open
03_certificate.pdf255.63 kBAdobe PDFView/Open
04_abstract.pdf43.74 kBAdobe PDFView/Open
05_acknowledgements.pdf44.49 kBAdobe PDFView/Open
06_list of publications.pdf43.15 kBAdobe PDFView/Open
07_table of contents.pdf45.18 kBAdobe PDFView/Open
08_list of figures.pdf43.62 kBAdobe PDFView/Open
09_list of tables.pdf58.05 kBAdobe PDFView/Open
10_list of abbreviations.pdf42.73 kBAdobe PDFView/Open
11_chapter 1.pdf254.23 kBAdobe PDFView/Open
12_chapter 2.pdf152.46 kBAdobe PDFView/Open
13_chapter 3.pdf192.79 kBAdobe PDFView/Open
14_chapter 4.pdf325.57 kBAdobe PDFView/Open
15_chapter 5.pdf117.61 kBAdobe PDFView/Open
16_chapter 6.pdf68.49 kBAdobe PDFView/Open
17_bibliography.pdf74.81 kBAdobe PDFView/Open
80_recommendation.pdf114.13 kBAdobe PDFView/Open
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