Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/350033
Title: | Deep Learning Model for Absence Seizure Pattern Detection |
Researcher: | Niha, K |
Guide(s): | Aisha Banu, W |
Keywords: | Computer Science Computer Science Software Engineering Engineering and Technology |
University: | B S Abdur Rahman Crescent Institute of Science and Technology |
Completed Date: | 2021 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/350033 |
Appears in Departments: | Department of Computer Science and Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
6.abstract-converted.pdf | Attached File | 33.5 kB | Adobe PDF | View/Open |
7.table of contents-converted.pdf | 192.79 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 189.56 kB | Adobe PDF | View/Open | |
ch1-converted.pdf | 378.7 kB | Adobe PDF | View/Open | |
ch2-converted.pdf | 714.26 kB | Adobe PDF | View/Open | |
ch3-converted.pdf | 293.78 kB | Adobe PDF | View/Open | |
ch4-converted.pdf | 430.46 kB | Adobe PDF | View/Open | |
ch5-converted.pdf | 378.97 kB | Adobe PDF | View/Open | |
ch6-converted.pdf | 246.78 kB | Adobe PDF | View/Open | |
ch7-converted.pdf | 157.81 kB | Adobe PDF | View/Open | |
ch8-converted.pdf | 79.08 kB | Adobe PDF | View/Open | |
references-converted.pdf | 141.86 kB | Adobe PDF | View/Open |
Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).
Altmetric Badge: