Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/349212
Title: Location of Faults In Double Circuit Transmission Line Using Artificial Intelligence Techniques
Researcher: Naresh Kumar. A
Guide(s): Seetharamaiah.N
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: GITAM University
Completed Date: 2021
Abstract: File Attached newline
Pagination: 
URI: http://hdl.handle.net/10603/349212
Appears in Departments:School of Technology Hyderabad Campus

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01_title.pdfAttached File50.55 kBAdobe PDFView/Open
02_declaration.pdf253.7 kBAdobe PDFView/Open
03_certificate.pdf287.93 kBAdobe PDFView/Open
04_acknowledgements.pdf135.9 kBAdobe PDFView/Open
05_contents.pdf74.21 kBAdobe PDFView/Open
06_list of tables.pdf70.42 kBAdobe PDFView/Open
07_list of figures.pdf49.13 kBAdobe PDFView/Open
08_list of abbreviations.pdf44.54 kBAdobe PDFView/Open
09_abstract.pdf113.22 kBAdobe PDFView/Open
10_chapter1.pdf164.7 kBAdobe PDFView/Open
11_chapter2.pdf207.36 kBAdobe PDFView/Open
12_chapter3.pdf309.03 kBAdobe PDFView/Open
13_chapter4.pdf538.01 kBAdobe PDFView/Open
14_chapter5.pdf148.96 kBAdobe PDFView/Open
15_chapter6.pdf50.43 kBAdobe PDFView/Open
16_references.pdf174.52 kBAdobe PDFView/Open
17_appendix.pdf62.88 kBAdobe PDFView/Open
18_list of publications.pdf45.97 kBAdobe PDFView/Open
80_recommendation.pdf164.7 kBAdobe PDFView/Open
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