1. Shodhganga@INFLIBNET
  2. Sant Longowal Institute of Engineering and Technology
  3. Department of Electronics and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/345803
Title: Some Studies on Machine Vision Based Inspection of Wheat Kernels
Researcher: Julka, Neeraj
Guide(s): Pharwaha, Amar Partap Singh
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
Kernels
Wheat
University: Sant Longowal Institute of Engineering and Technology
Completed Date: 2021
Abstract: file attached
Pagination: 184 p.
URI: http://hdl.handle.net/10603/345803
Appears in Departments:Department of Electronics and Communication Engineering

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File Description SizeFormat 
01_title.pdfAttached File66.09 kBAdobe PDFView/Open
02_dedication.pdf6.33 kBAdobe PDFView/Open
03_certificate.pdf136.6 kBAdobe PDFView/Open
04_abstract.pdf15.73 kBAdobe PDFView/Open
05_acknowledgement.pdf62.77 kBAdobe PDFView/Open
06_content.pdf285.98 kBAdobe PDFView/Open
07_chapter 1.pdf261.93 kBAdobe PDFView/Open
08_chapter 2.pdf524.22 kBAdobe PDFView/Open
09_chapter 3.pdf2.47 MBAdobe PDFView/Open
10_chapter 4.pdf682.46 kBAdobe PDFView/Open
11_chapter 5.pdf687.03 kBAdobe PDFView/Open
12_chapter 6.pdf1.36 MBAdobe PDFView/Open
13_chapter 7.pdf686.42 kBAdobe PDFView/Open
14_chapter 8.pdf732.99 kBAdobe PDFView/Open
15_references.pdf269.61 kBAdobe PDFView/Open
80_recommendation.pdf169.1 kBAdobe PDFView/Open
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