1. Shodhganga@INFLIBNET
  2. Visvesvaraya Technological University, Belagavi
  3. Department of Electrical and Electronics Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/344422
Title: Cell stability analysis for a high speed SRAM bit cell
Researcher: Shivaprakash, G
Guide(s): Suresh, D S
Keywords: Engineering and Technology
Engineering Electrical and Electronic
University: Visvesvaraya Technological University, Belagavi
Completed Date: 2020
Abstract: newline
Pagination: XIII, 328
URI: http://hdl.handle.net/10603/344422
Appears in Departments:Department of Electrical and Electronics Engineering

Files in This Item:
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01_title page.pdf.pdfAttached File53.52 kBAdobe PDFView/Open
02_certificate.pdf.pdf29.07 kBAdobe PDFView/Open
03_declaration.pdf.pdf33.77 kBAdobe PDFView/Open
04_abstract.pdf.pdf36.08 kBAdobe PDFView/Open
05_content.pdf.pdf28.74 kBAdobe PDFView/Open
06_chapter 1.pdf.pdf218.61 kBAdobe PDFView/Open
07_chapter 2.pdf.pdf724.52 kBAdobe PDFView/Open
08_chapter 3.pdf.pdf270.52 kBAdobe PDFView/Open
09_chapter 4.pdf.pdf178.56 kBAdobe PDFView/Open
10_chapter 5.pdf.pdf79.18 kBAdobe PDFView/Open
11_chapter 6.pdf.pdf28.32 kBAdobe PDFView/Open
12_chapter 7.pdf.pdf27.28 kBAdobe PDFView/Open
13_references.pdf.pdf61.86 kBAdobe PDFView/Open
14_appendix.pdf.pdf88.59 kBAdobe PDFView/Open
15_publications.pdf.pdf959.35 kBAdobe PDFView/Open
80_recommendation.pdf79.95 kBAdobe PDFView/Open
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