Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/335946
Title: | Electrical Transport and Thermal Noise in Single Injection Solid State Diode with Traps |
Researcher: | Chaudhary, Anil Kumar |
Guide(s): | Sharma , Y K |
Keywords: | Physical Sciences Physics Physics Applied |
University: | Dr. B. R. Ambedkar University Agra |
Completed Date: | 1988 |
Abstract: | None newline |
Pagination: | 187 |
URI: | http://hdl.handle.net/10603/335946 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01title 1-1.pdf | Attached File | 124.28 kB | Adobe PDF | View/Open |
02 certificate 1-1.pdf | 174.6 kB | Adobe PDF | View/Open | |
03 preliminary pages 1-14.pdf | 2.44 MB | Adobe PDF | View/Open | |
04 chapter 1 1-54.pdf | 12.78 MB | Adobe PDF | View/Open | |
05 chapter 2 55-106.pdf | 9.41 MB | Adobe PDF | View/Open | |
06 chapter 3 107-154.pdf | 8.37 MB | Adobe PDF | View/Open | |
07 chapter 4 155-171.pdf | 3.33 MB | Adobe PDF | View/Open | |
08 references 157 172-186.pdf | 2.55 MB | Adobe PDF | View/Open | |
09 list of publication 1-1.pdf | 178.24 kB | Adobe PDF | View/Open | |
80_recommendation.pdf | 3.33 MB | Adobe PDF | View/Open |
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