Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/335946
Title: Electrical Transport and Thermal Noise in Single Injection Solid State Diode with Traps
Researcher: Chaudhary, Anil Kumar
Guide(s): Sharma , Y K
Keywords: Physical Sciences
Physics
Physics Applied
University: Dr. B. R. Ambedkar University Agra
Completed Date: 1988
Abstract: None newline
Pagination: 187
URI: http://hdl.handle.net/10603/335946
Appears in Departments:Department of Physics

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01title 1-1.pdfAttached File124.28 kBAdobe PDFView/Open
02 certificate 1-1.pdf174.6 kBAdobe PDFView/Open
03 preliminary pages 1-14.pdf2.44 MBAdobe PDFView/Open
04 chapter 1 1-54.pdf12.78 MBAdobe PDFView/Open
05 chapter 2 55-106.pdf9.41 MBAdobe PDFView/Open
06 chapter 3 107-154.pdf8.37 MBAdobe PDFView/Open
07 chapter 4 155-171.pdf3.33 MBAdobe PDFView/Open
08 references 157 172-186.pdf2.55 MBAdobe PDFView/Open
09 list of publication 1-1.pdf178.24 kBAdobe PDFView/Open
80_recommendation.pdf3.33 MBAdobe PDFView/Open
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